The Analysis of Capacitance-Voltage and Conductance voltage Characteristics of Zr/p-Si Schottky Diodes with a Native Oxide Interfacial Layer at High Frequencies


ALDEMİR D. A. , ÖZDEMİR A. F. , UÇAR N.

International Natural Science, Engineering and Materials Technology Conference (NEM 2019), 9 - 10 September 2019, pp.87

  • Publication Type: Conference Paper / Summary Text
  • Page Numbers: pp.87