The Analysis of Capacitance-Voltage and Conductance voltage Characteristics of Zr/p-Si Schottky Diodes with a Native Oxide Interfacial Layer at High Frequencies

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ALDEMİR D. A. , ÖZDEMİR A. F. , UÇAR N.

International Natural Science, Engineering and Materials Technology Conference (NEM 2019), 9 - 10 September 2019, pp.87

• Publication Type: Conference Paper / Summary Text
• Page Numbers: pp.87