A STUDY OF THE ELECTRON OPTICAL PROPERTIES OF HEMISPHERICAL DEFLECTION ANALYZERS AIMED AT OPTIMIZING THEIR FRINGING FIELD CORRECTION SCHEMES


Sise O.

UNIVERSITY POLITEHNICA OF BUCHAREST SCIENTIFIC BULLETIN-SERIES A-APPLIED MATHEMATICS AND PHYSICS, vol.77, no.1, pp.213-222, 2015 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 77 Issue: 1
  • Publication Date: 2015
  • Title of Journal : UNIVERSITY POLITEHNICA OF BUCHAREST SCIENTIFIC BULLETIN-SERIES A-APPLIED MATHEMATICS AND PHYSICS
  • Page Numbers: pp.213-222

Abstract

First-order focusing characteristic of hemispherical deflection analyzers (HDAs) is limited due to fringing field at the boundaries of the electrodes. In this paper, we present a systematic study of fringing field effects for different ratios of the gap to mean radius in the range of 0.2 <= Delta R/R-m <= 0.6 and compare the performance of some useful designs, i. e., ideal HDA, fringing field HDA, Herzog correction, Jost correction, tilted input beam angle, and biased paracentric configuration for resolution improvement.