A STUDY OF THE ELECTRON OPTICAL PROPERTIES OF HEMISPHERICAL DEFLECTION ANALYZERS AIMED AT OPTIMIZING THEIR FRINGING FIELD CORRECTION SCHEMES
UNIVERSITY POLITEHNICA OF BUCHAREST SCIENTIFIC BULLETIN-SERIES A-APPLIED MATHEMATICS AND PHYSICS, cilt.77, sa.1, ss.213-222, 2015 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 77 Sayı: 1
- Basım Tarihi: 2015
- Dergi Adı: UNIVERSITY POLITEHNICA OF BUCHAREST SCIENTIFIC BULLETIN-SERIES A-APPLIED MATHEMATICS AND PHYSICS
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.213-222
- Süleyman Demirel Üniversitesi Adresli: Hayır
Özet
First-order focusing characteristic of hemispherical deflection analyzers (HDAs) is limited due to fringing field at the boundaries of the electrodes. In this paper, we present a systematic study of fringing field effects for different ratios of the gap to mean radius in the range of 0.2 <= Delta R/R-m <= 0.6 and compare the performance of some useful designs, i. e., ideal HDA, fringing field HDA, Herzog correction, Jost correction, tilted input beam angle, and biased paracentric configuration for resolution improvement.