EVALUATION OF PAPER TWO SIDEDNESS WITH SEM/AFM MICROSCOPE TECHNIQUE


Sahin H. T.

WOOD RESEARCH, vol.56, no.2, pp.203-212, 2011 (Peer-Reviewed Journal) identifier

  • Publication Type: Article / Article
  • Volume: 56 Issue: 2
  • Publication Date: 2011
  • Journal Name: WOOD RESEARCH
  • Journal Indexes: Science Citation Index Expanded, Scopus
  • Page Numbers: pp.203-212

Abstract

The atomic force microscopy ARM and scanning electron microscopy SEM micrographs show non-uniformly distributed grainy particles with various shapes on the paper surface. However, AFM studies revealed the features of the paper surfaces are probably caused by different physical and chemical processes. The height feature and roughness parameters may be used to make automated measurements between images. AFM methods are likely to be useful for detecting topographical changes on surface structures as well as for the clarification of the surface dislocation phenomena such as; two sidedness.