Effect of external electric field on C-X center dot center dot center dot halogen bonds
JOURNAL OF MOLECULAR MODELING, cilt.25, 2019 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 25
- Basım Tarihi: 2019
- Doi Numarası: 10.1007/s00894-019-3938-2
- Dergi Adı: JOURNAL OF MOLECULAR MODELING
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Süleyman Demirel Üniversitesi Adresli: Evet
Özet
In this study, ab initio calculations (RI-MP2(full)/aug-cc-pVDZ) are performed to investigate the effect of an external electric field (EEF) on the nature, properties, and structures of C-X halogen bonds in CF3Br complexes with systems (benzene, ethene, and ethyne), for the first time. This EEF effect is analyzed by a myriad of methods, including molecular electrostatic potential (MEP), symmetry adapted perturbation theory (SAPT), natural bond orbital (NBO), quantum theory of atoms in molecules (QTAIM), and noncovalent interaction (NCI) methods. A linear relationship is found between RI-MP2 interaction energy and the strength of the EEF, indicating that the stability of C-X