Optical and electrical characterization of thin film MSP heterojunction based on organic material Al/p-Si/P3HT/Ag

Meftah S. E. , Benhaliliba M., Kaleli M., Benouis C. E. , Yavru C. A. , Bayram A. B.

PHYSICA B-CONDENSED MATTER, cilt.593, 2020 (SCI İndekslerine Giren Dergi) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 593
  • Basım Tarihi: 2020
  • Doi Numarası: 10.1016/j.physb.2020.412238


Fabrication and characterization of metal/semiconductor/polymer/metal (MSP) heterojunction diode are reported. The Al/p-Si/P3HT/Ag MSP heterojunction have been manufactured by a homemade ultrasonic spray pyrolysis (USP) method, and the organic layer has a thickness of similar to 150 nm and silver as front contact is deposited by physical vapor deposition (PVD) technique. The organic layer is deposited on glass and has been subject of XRD diffraction, patterns which revealed a grain size of similar to 18 nm, UV-Vis measurement and scanning electron microscope (SEM) images characterization.